August 5th, 2014
DensBits' CTO to Participate in Open Plenary Session, 2014 Flash Memory Summit
Santa Clara Convention Center
Come and Hear DensBits' CTO Discuss "Is 3D NAND a Disruptive Technology for Flash Storage?"
Open Plenary Session, August 5th, 6:00 - 7:00pm
With 3D NAND scaling by adding vertical layers, we see diminishing returns and reliability degradation. In addition, lithography scaling is limited, and therefore adding bits per call becomes a major scaling factor. This introduces its own reliability issues.